Test and Reliability of Magnetic Random Access Memories - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2011
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lirmm-00679516 , version 1 (15-03-2012)

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  • HAL Id : lirmm-00679516 , version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Test and Reliability of Magnetic Random Access Memories. GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France. ⟨lirmm-00679516⟩
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