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Conference Papers Year : 2011

Test and Reliability of Magnetic Random Access Memories

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679516

Submitted on : Thursday, March 15, 2012-5:32:17 PM

Last modification on : Friday, March 24, 2023-2:52:55 PM

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lirmm-00679516 , version 1 (15-03-2012)

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  • HAL Id : lirmm-00679516 , version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Test and Reliability of Magnetic Random Access Memories. GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France. ⟨lirmm-00679516⟩

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