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Test and Reliability of Magnetic Random Access Memories

João Azevedo Arnaud Virazel 1 Alberto Bosio 1 Luigi Dilillo 1 Patrick Girard 1 Serge Pravossoudovitch 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679516
Contributor : Martine Peridier <>
Submitted on : Thursday, March 15, 2012 - 5:32:17 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00679516, version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Test and Reliability of Magnetic Random Access Memories. GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France. ⟨lirmm-00679516⟩

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