Analysis of Resistive-Open Defects in TAS-MRAM Array

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679524
Contributor : Martine Peridier <>
Submitted on : Thursday, March 15, 2012 - 5:42:30 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00679524, version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis of Resistive-Open Defects in TAS-MRAM Array. ITC: International Test Conference, Sep 2011, Anaheim, CA, United States. ⟨lirmm-00679524⟩

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