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Conference Papers Year : 2011

Analysis of Resistive-Open Defects in TAS-MRAM Array

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lirmm-00679524 , version 1 (15-03-2012)

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  • HAL Id : lirmm-00679524 , version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis of Resistive-Open Defects in TAS-MRAM Array. ITC: International Test Conference, Sep 2011, Anaheim, CA, United States. ⟨lirmm-00679524⟩
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