Analysis of Resistive-Open Defects in TAS-MRAM Array - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2011

Analysis of Resistive-Open Defects in TAS-MRAM Array

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679524

Submitted on : Thursday, March 15, 2012-5:42:30 PM

Last modification on : Tuesday, September 3, 2024-11:14:08 AM

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lirmm-00679524 , version 1 (15-03-2012)

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  • HAL Id : lirmm-00679524 , version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis of Resistive-Open Defects in TAS-MRAM Array. ITC: International Test Conference, Sep 2011, Anaheim, CA, United States. ⟨lirmm-00679524⟩

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