Are Advanced DfT Structures Sufficient for Preventing Scan-Attacks?

Jean Da Rolt 1 Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Standard Design for Testability (DfT) structures are well known as potential sources of confidential information leakage. Scan-based attacks have been reported in publications since the early 2000s. It has been shown for instance that the secret key for symmetric encryption standards (DES, AES) could be retrieved from information gathered on scan-out pins when scan-chains are fully observed through these pins. However DfT practices have progressed to adapt to large and complex designs such as test response compaction, associated Xmasking structure, partial scan, etc. As a side effect, these techniques mask part of the information collected on scan outputs. Thus, at first glance, they may appear as countermeasures against scan-based attacks. Nevertheless, in this paper we show that DfT structures, regardless of their nature, do not inherently enhance security and that specific additional countermeasures are still needed. We propose a newscan attack able to deal with designs where only part of the internal circuit's state is observed for test purpose.
Type de document :
Communication dans un congrès
VTS'12: 30th IEEE VLSI Test Symposium, Apr 2012, Maui, Hawai, United States. IEEE, pp.246-251, 2012, IEEE Catalog number : CFP12029-CDR. 〈http://www.tttc-vts.org/public_html/new/2012/index.php〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00694536
Contributeur : Bruno Rouzeyre <>
Soumis le : vendredi 4 mai 2012 - 15:52:05
Dernière modification le : mardi 23 octobre 2018 - 10:46:02

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  • HAL Id : lirmm-00694536, version 1

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Jean Da Rolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Are Advanced DfT Structures Sufficient for Preventing Scan-Attacks?. VTS'12: 30th IEEE VLSI Test Symposium, Apr 2012, Maui, Hawai, United States. IEEE, pp.246-251, 2012, IEEE Catalog number : CFP12029-CDR. 〈http://www.tttc-vts.org/public_html/new/2012/index.php〉. 〈lirmm-00694536〉

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