How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios? - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2012

How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?

Abstract

This work analyses and classifies strategies for sampling results of concurrent error detection (CED) schemes in transient fault scenarios. It shows that dealing with results - indicating the occurrence of transient faults in circuits - can require additional mechanisms to make the error indication useful for system's recovery procedures. The paper highlights that not all error indications are noticed by certain strategies of varied costs, and therefore their efficiencies in sampling results as well as the performance, power, and area overheads added to the CED schemes must be considered. The work then finishes presenting a qualitative comparison between existing strategies in function of design goals.
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Dates and versions

lirmm-00701776 , version 1 (26-05-2012)

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Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?. RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Sevilla, Spain. pp.635-642, ⟨10.1109/RADECS.2011.6131361⟩. ⟨lirmm-00701776⟩
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