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Robust Modular Bulk Built-In Current Sensors for Detection of Transient Faults

Abstract : Soft error resilience is an increasingly important requirement of integrated circuits realized in CMOS nanometer technologies. Among the several approaches, Bulk Built-in Current Sensors (BBICS) offer a promising solution as they are able to detect particle strikes immediately after its occurrence. Based on this idea we demonstrate a novel modular BBICS (mBBICS) that tackles the main problems of these integrated sensors - area, leakage, and robustness. Simulations based on a predictive nanometer technology indicate competitive response times for high performance applications at the cost of 25 % area overhead and very low power penalty. Thereby, all simulated particle strikes that lead to transient faults could be detected. Additionally reliability analysis proved the robustness of the proposed mBBICS against wide variations of temperature and process parameters.
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Contributor : Rodrigo Possamai Bastos Connect in order to contact the contributor
Submitted on : Saturday, October 6, 2012 - 7:00:13 AM
Last modification on : Tuesday, September 6, 2022 - 4:56:46 PM
Long-term archiving on: : Thursday, December 15, 2016 - 8:58:52 PM


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Frank Sill Torres, Rodrigo Possamai Bastos. Robust Modular Bulk Built-In Current Sensors for Detection of Transient Faults. SBCCI'2012: 25th Symposium onIntegrated Circuits and Systems Design, Aug 2012, Brasilia, Brazil. pp.1-6, ⟨10.1109/SBCCI.2012.6344422⟩. ⟨lirmm-00715122⟩



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