Robust Modular Bulk Built-In Current Sensors for Detection of Transient Faults

Frank Sill Torres 1 Rodrigo Possamai Bastos 2
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Soft error resilience is an increasingly important requirement of integrated circuits realized in CMOS nanometer technologies. Among the several approaches, Bulk Built-in Current Sensors (BBICS) offer a promising solution as they are able to detect particle strikes immediately after its occurrence. Based on this idea we demonstrate a novel modular BBICS (mBBICS) that tackles the main problems of these integrated sensors - area, leakage, and robustness. Simulations based on a predictive nanometer technology indicate competitive response times for high performance applications at the cost of 25 % area overhead and very low power penalty. Thereby, all simulated particle strikes that lead to transient faults could be detected. Additionally reliability analysis proved the robustness of the proposed mBBICS against wide variations of temperature and process parameters.
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Submitted on : Saturday, October 6, 2012 - 7:00:13 AM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM
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Frank Sill Torres, Rodrigo Possamai Bastos. Robust Modular Bulk Built-In Current Sensors for Detection of Transient Faults. SBCCI'2012: 25th Symposium onIntegrated Circuits and Systems Design, Brazil. pp.1-6, ⟨10.1109/SBCCI.2012.6344422⟩. ⟨lirmm-00715122⟩

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