Embedding Statistical Tests for On-Chip Dynamic Voltage and Temperature Monitoring - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Communication Dans Un Congrès Année : 2012

Embedding Statistical Tests for On-Chip Dynamic Voltage and Temperature Monitoring

Résumé

All mobile applications require high performances with very long battery life. The speed and power consumption trade-off clearly appears as a prominent challenge to optimize the overall energy efficiency. In MultiProcessor System-On-Chip architectures, the trade-off is usually achieved by dynamically adapting the supply voltage and the operating frequency of a processor cluster or of each processor at fine grain. This requires monitoring accurately, on-chip and at runtime, the supply voltage and temperature across the die. Within this context, this paper introduces a method to es-timate, from on-chip measurements, using embedded statistical tests, the supply voltage and temperature of small die area using low-cost digital sensors featuring a set of ring oscillators solely. The results obtained, considering a 32nm process, demonstrate the efficiency of the proposed method. Indeed, voltage and temperature measurement errors are kept, in average, below 5mV and 7°C, respectively.
Fichier non déposé

Dates et versions

lirmm-00762020 , version 1 (06-12-2012)

Identifiants

  • HAL Id : lirmm-00762020 , version 1

Citer

Philippe Maurine, Lionel Vincent, Suzanne Lesecq, Edith Beigné. Embedding Statistical Tests for On-Chip Dynamic Voltage and Temperature Monitoring. DAC: Design Automation Conference, Jun 2012, San Francisco, CA, United States. pp.994-999. ⟨lirmm-00762020⟩
119 Consultations
0 Téléchargements

Partager

More