Paolo Rech, Jean-Marc J.-M. Galliere, Patrick Girard, Alessio Griffoni, Jérôme Boch, et al.. Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress.
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.893-899.
⟨10.1109/TNS.2012.2187218⟩.
⟨lirmm-00805031⟩