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Conference papers

Dynamic-Stress Neutrons Test of Commercial SRAMs

Paolo Rech 1 Jean-Marc J.-M. Galliere 1 Patrick Girard 1 Frédéric Wrobel 2, 3 Frédéric Saigné 2, 3 Luigi Dilillo 1, * 
* Corresponding author
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 RADIAC - Radiations et composants
IES - Institut d’Electronique et des Systèmes
Abstract : We present a new dynamic test protocol for stressing irradiated commercially available SRAMs. Experimental results attest that cell-level stress must be applied to measure an accurate neutron-induced error rate of devices under working conditions.
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Conference papers
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Contributor : Luigi Dilillo Connect in order to contact the contributor
Submitted on : Wednesday, March 27, 2013 - 4:32:10 PM
Last modification on : Tuesday, May 17, 2022 - 2:10:04 PM


  • HAL Id : lirmm-00805349, version 1



Paolo Rech, Jean-Marc J.-M. Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Dynamic-Stress Neutrons Test of Commercial SRAMs. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4. ⟨lirmm-00805349⟩



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