Dynamic-Stress Neutrons Test of Commercial SRAMs

We present a new dynamic test protocol for stressing irradiated commercially available SRAMs. Experimental results attest that cell-level stress must be applied to measure an accurate neutron-induced error rate of devices under working conditions.

Mots clés

Neutron Soft Errors Dynamic Stress SRAM

Domaines

Electronique

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805349

Soumis le : mercredi 27 mars 2013-16:32:10

Dernière modification le : vendredi 24 mars 2023-14:52:56

Dates et versions

lirmm-00805349 , version 1 (27-03-2013)

Identifiants

HAL Id : lirmm-00805349 , version 1

Citer

Paolo Rech, Jean-Marc J.-M. Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Dynamic-Stress Neutrons Test of Commercial SRAMs. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4. ⟨lirmm-00805349⟩

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