Conference Papers
Year : 2012
Arnaud Virazel : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806827
Submitted on : Tuesday, April 2, 2013-2:37:52 PM
Last modification on : Friday, March 24, 2023-2:52:57 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00806827 , version 1
Cite
João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures. JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France. ⟨lirmm-00806827⟩
Collections
117
View
0
Download