Conference Papers Year : 2012
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lirmm-00806827 , version 1 (02-04-2013)

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  • HAL Id : lirmm-00806827 , version 1

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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures. JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France. ⟨lirmm-00806827⟩
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