Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00816606
Contributor : Patrick Girard <>
Submitted on : Monday, April 22, 2013 - 3:37:42 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00816606, version 1

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Patrick Girard, Mohammad Tehranipoor, Hassan Salmani, Wei Zhao, Xiaoqing Wen. Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns. Journal of Low Power Electronics, American Scientific Publishers, 2012, 8 (2), pp.248-258. ⟨lirmm-00816606⟩

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