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Conference Papers Year : 2009

Power-Aware Testing and Test Strategies for Low Power Devices

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Micro and nanotechnologies/Microelectronics
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Patrick Girard  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00820650

Submitted on : Monday, May 6, 2013-12:58:17 PM

Last modification on : Friday, March 24, 2023-2:52:57 PM

Long-term archiving on: Monday, August 19, 2013-3:20:58 PM

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Dates and versions

lirmm-00820650 , version 1 (06-05-2013)

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  • HAL Id : lirmm-00820650 , version 1

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Patrick Girard, Nicola Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. ⟨lirmm-00820650⟩

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