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Power-Aware Testing and Test Strategies for Low Power Devices

Abstract : Tutorial
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00820650
Contributor : Patrick Girard Connect in order to contact the contributor
Submitted on : Monday, May 6, 2013 - 12:58:17 PM
Last modification on : Monday, October 11, 2021 - 1:24:10 PM
Long-term archiving on: : Monday, August 19, 2013 - 3:20:58 PM

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Patrick Girard, Nicola Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. ⟨lirmm-00820650⟩

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