A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2013

A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic

Abstract

This paper presents a new recovery scheme for dealing with short-to-long duration transient faults in combinational logic. The new scheme takes earlier into account results of concurrent error detection (CED) mechanisms, and then it is able to perform shorter recovery latencies than existing similar strategy. The proposed scheme also requires less memory resources to save input contexts of combinational logic blocks. In addition, this work also proposes a taxonomy of CED techniques. It allows pointing out which are the necessary recovery resources as well as identifying which are the types of CED mechanisms that can be used with the new recovery scheme of this paper. The effectiveness of the proposed scheme was evaluated through electrical-level simulations. For all short-to-long duration transient-fault injections, it was never slower than state-of-art similar strategy, and indeed its recovery latency was faster for 34 % of the simulated faulty scenarios.
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Dates and versions

lirmm-00838389 , version 1 (25-06-2013)

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Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Feng Lu, Bruno Rouzeyre. A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic. Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.331-340. ⟨10.1007/s10836-013-5359-y⟩. ⟨lirmm-00838389⟩
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