Low-cost phase noise testing of complex RF ICs using standard digital ATE

Abstract : This paper introduces a low-cost technique for phase noise testing of complex RF devices. The technique is based on the acquisition of the signal delivered on the IF output by a standard digital Automated Test Equipment (ATE). A dedicated digital processing algorithm is proposed that permits to achieve phase noise evaluation from the captured binary data. An experimental setup is developed to validate the proposed technique and measurements on actual analog signals demonstrate a very good agreement with conventional phase noise measurements.
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Communication dans un congrès
ITC'14: International Test Conference, Oct 2014, Seattle, WA, United States. IEEE, 2014, 〈10.1109/TEST.2014.7035301〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01119356
Contributeur : Florence Azais <>
Soumis le : lundi 23 février 2015 - 09:40:10
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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Stephane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC'14: International Test Conference, Oct 2014, Seattle, WA, United States. IEEE, 2014, 〈10.1109/TEST.2014.7035301〉. 〈lirmm-01119356〉

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