Low-cost phase noise testing of complex RF ICs using standard digital ATE - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2014

Low-cost phase noise testing of complex RF ICs using standard digital ATE

Abstract

This paper introduces a low-cost technique for phase noise testing of complex RF devices. The technique is based on the acquisition of the signal delivered on the IF output by a standard digital Automated Test Equipment (ATE). A dedicated digital processing algorithm is proposed that permits to achieve phase noise evaluation from the captured binary data. An experimental setup is developed to validate the proposed technique and measurements on actual analog signals demonstrate a very good agreement with conventional phase noise measurements.
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Dates and versions

lirmm-01119356 , version 1 (23-02-2015)

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Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩. ⟨lirmm-01119356⟩
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