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Low-cost phase noise testing of complex RF ICs using standard digital ATE

Stéphane David-Grignot 1 Florence Azaïs 1 Laurent Latorre 2 François Lefevre 3
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 NXP Semiconductors
Abstract : This paper introduces a low-cost technique for phase noise testing of complex RF devices. The technique is based on the acquisition of the signal delivered on the IF output by a standard digital Automated Test Equipment (ATE). A dedicated digital processing algorithm is proposed that permits to achieve phase noise evaluation from the captured binary data. An experimental setup is developed to validate the proposed technique and measurements on actual analog signals demonstrate a very good agreement with conventional phase noise measurements.
Keywords : Time-domain analysis Noise measurement Frequency measurement Radio frequency Phase noise Phase measurement Standards
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01119356
Contributor : Florence Azais Connect in order to contact the contributor
Submitted on : Monday, February 23, 2015 - 9:40:10 AM
Last modification on : Monday, October 11, 2021 - 1:24:40 PM

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CNRS | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | SMARTIES | TEST

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Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩. ⟨lirmm-01119356⟩

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