Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Low-cost phase noise testing of complex RF ICs using standard digital ATE.
ITC: International Test Conference, Oct 2014, Seattle, WA, United States.
⟨10.1109/TEST.2014.7035301⟩.
⟨lirmm-01119356⟩