Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing

Syhem Larguech 1 Florence Azaïs 1 Serge Bernard 1 Vincent Kerzérho 1 Mariane Comte 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper is in the field of Analog or RF integrated circuit testing. The conventional practice for testing those circuits relies on the measurement of the device-under-test (DUT) specifications. In order to reduce test costs, a promising approach, called indirect or alternate testing has been proposed. Its basic principle consists in using the correlation between the conventional analog/RF performances and some low-cost measurements, called Indirect Measurements (IMs), in order to estimate the analog/RF parameters without measuring directly them. The objective of this paper is to perform a comparative analysis of different IM selection strategies in order to define efficient alternate testing implementation. Efficiency is discussed in terms of model accuracy and predictions robustness. Results are illustrated on a Power Amplifier (PA) test vehicle for which we have experimental test data on 10,000 circuits.
Type de document :
Communication dans un congrès
LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. 15th IEEE Latin American Test Workshop, pp.1-6, 2014, 〈10.1109/LATW.2014.6841930〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01119361
Contributeur : Florence Azais <>
Soumis le : lundi 23 février 2015 - 09:46:38
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. 15th IEEE Latin American Test Workshop, pp.1-6, 2014, 〈10.1109/LATW.2014.6841930〉. 〈lirmm-01119361〉

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