Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies

Syhem Larguech 1 Florence Azaïs 1 Serge Bernard 1 Mariane Comte 1 Vincent Kerzérho 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : The conventional practice for testing analog or RF integrated circuits is specification-based testing, which relies on the direct measurement of the circuit performance parameters. This approach offers good test quality but at the price of extremely high testing costs. In order to reduce test costs, a promising approach, called indirect or alternate testing has been proposed. Its basic principle consists in using the correlation between the conventional analog/RF performances and some low-cost measurements, called Indirect Measurements (IMs), in order to estimate the analog/RF parameters without measuring them directly. In this paper, we perform efficiency evaluation of this strategy, and in particular we perform a comparative analysis of different IM selection strategies in order to define efficient alternate testing implementation. Efficiency is evaluated in terms of model accuracy by using classical metrics such as average and maximal prediction errors, and in terms of prediction reliability by introducing a new metric called Failing Prediction Rate (FPR). Results are illustrated on two case studies for which we have experimental test data.
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Article dans une revue
Microelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102. 〈10.1016/j.mejo.2015.09.014〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01232890
Contributeur : Florence Azais <>
Soumis le : mardi 24 novembre 2015 - 12:07:35
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102. 〈10.1016/j.mejo.2015.09.014〉. 〈lirmm-01232890〉

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