Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range

Stéphane David-Grignot 1 Florence Azaïs 2 Laurent Latorre 2 François Lefevre 1
1 NXP Semiconductors
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper deals with low-cost phase noise testing of sinusoidal analog/IF signals. The idea is to perform over-sampled 1-bit signal acquisition using standard digital ATE and to apply dedicated post-processing in order to retrieve the phase noise level present in the analog/IF signal from the captured binary vector. A first algorithm has already been developed, which shows an excellent agreement with conventional phase noise measurements on a large range of injected noise but diverges from conventional method in case of very low phase noise level. In this paper, we present a new processing algorithm that permits to alleviate this limitation. Both simulations and hardware measurements are realized to validate the technique and results clearly demonstrate the improved performance of the new algorithm.
Keywords : one bit acquisition phase noise Analog/RF integrated circuits analog signals digital ATE digital signal processing noise measurement test cost reduction
Type de document :
Article dans une revue
Journal of Electronic Testing, Springer Verlag, 2015, pp.1-17. 〈10.1007/s10836-015-5548-y〉
Liste complète des métadonnées
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01233017
Contributeur : Florence Azais <>
Soumis le : mardi 24 novembre 2015 - 12:17:08
Dernière modification le : jeudi 28 juin 2018 - 18:44:07

Identifiants

Collections

SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | SMARTIES | TEST

Citation

Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. Journal of Electronic Testing, Springer Verlag, 2015, pp.1-17. 〈10.1007/s10836-015-5548-y〉. 〈lirmm-01233017〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

98

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD