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A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition

Stéphane David-Grignot 1, 2 Florence Azaïs 2 Laurent Latorre 3 François Lefevre 1
1 NXP Semiconductors
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper introduces a new technique for low-cost phase noise production testing from 1-bit signal acquisition. The technique relies on reconstruction of phase fluctuation from the binary vector captured by a digital ATE channel. A dedicated post-processing algorithm is developed that permits phase noise evaluation from the analysis of the reconstructed time-domain phase fluctuation. The technique is validated through hardware measurements and results demonstrate an excellent agreement with conventional phase noise measurements.
Keywords : Test cost reduction Phase noise Analog signals 1-bit acquisition Digital ATE Digital signal processing
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01233093
Contributor : Florence Azais <>
Submitted on : Tuesday, November 24, 2015 - 2:32:15 PM
Last modification on : Tuesday, June 2, 2020 - 7:56:02 PM

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CNRS | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | SMARTIES | TEST

Citation

Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition. ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/ETS.2015.7138761⟩. ⟨lirmm-01233093⟩

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