A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition

Stéphane David-Grignot 1 Florence Azaïs 2 Laurent Latorre 2 François Lefevre 1
1 NXP Semiconductors
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper introduces a new technique for low-cost phase noise production testing from 1-bit signal acquisition. The technique relies on reconstruction of phase fluctuation from the binary vector captured by a digital ATE channel. A dedicated post-processing algorithm is developed that permits phase noise evaluation from the analysis of the reconstructed time-domain phase fluctuation. The technique is validated through hardware measurements and results demonstrate an excellent agreement with conventional phase noise measurements.
Keywords : phase noise analog signals 1-bit acquisition digital ATE digital signal processing test cost reduction
Type de document :
Communication dans un congrès
ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. IEEE, Proc. IEEE European Test Symposium 2015 (ETS'15), pp.1-6, 2015, 〈10.1109/ETS.2015.7138761〉
Liste complète des métadonnées
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01233093
Contributeur : Florence Azais <>
Soumis le : mardi 24 novembre 2015 - 14:32:15
Dernière modification le : jeudi 28 juin 2018 - 18:44:07

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SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | SMARTIES | TEST

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Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre. A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition. ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. IEEE, Proc. IEEE European Test Symposium 2015 (ETS'15), pp.1-6, 2015, 〈10.1109/ETS.2015.7138761〉. 〈lirmm-01233093〉

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