An SRAM Based Monitor for Mixed-Field Radiation Environments

Georgios Tsiligiannis 1 Luigi Dilillo 1 Alberto Bosio 1 Patrick Girard 1 Serge Pravossoudovitch 1 Aida Todri-Sanial 2 Arnaud Virazel 1 Julien Mekki 3, 1 Markus Brugger 3, 1 Frédéric Wrobel 4, 5, 1 Frédéric Saigné 4, 5, 1
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
4 RADIAC - Radiations et composants
IES - Institut d’Electronique et des Systèmes
Abstract : CERN hosts a large number of electronic devices and equipment, functioning over its different particle accelerators. In certain areas, they operate in harsh radiation environments. In order to assure their proper functionality, the equipment or some of their sensitive components undergo several tests in experimental test areas representative of the LHC radiation fields, while specialized monitors constantly record the respective radiation levels. The purpose of this study is to evaluate the use of monitors using recent technology nodes (90 nm) in order to have a better estimation of the expected error rate of the devices. The H4IRRAD experimental test area has been specifically designed to reproduce the radiation field that is present within the LHC tunnel and shielded areas. It has been used to test our custom SRAM based monitors. The monitors have been exposed to a maximum dose and high energy hadron fluence of about 76 Gy and 1.3 × 1011 cm-2 respectively. The results show that the total ionizing dose (TID) effect does not impact the bit cross section of our devices. Moreover the Single Event occurrence is coherent to the beam intensity fluctuations, proving that these devices are appropriate for SEU monitoring under mixed particle fields.
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Journal articles
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234441
Contributor : Luigi Dilillo <>
Submitted on : Thursday, November 26, 2015 - 10:27:11 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. An SRAM Based Monitor for Mixed-Field Radiation Environments. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩. ⟨lirmm-01234441⟩

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