Investigation on MCU Clustering Methodologies for Cross-Section Estimation of SRAMs

Abstract : Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
Type de document :
Communication dans un congrès
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, United States. IEEE, 2015, IEEE Nuclear and Space Radiation Effects Conferencee, Boston, USA, 2015. 〈http://www.nsrec.com/2015Brochure.pdf〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01237731
Contributeur : Luigi Dilillo <>
Soumis le : jeudi 3 décembre 2015 - 16:41:28
Dernière modification le : jeudi 11 janvier 2018 - 06:27:29

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  • HAL Id : lirmm-01237731, version 1

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Alexandre Bosser, Viyas Gupta, Arto Javanainen, Heikki Kettunen, Helmut Puchner, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of SRAMs. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, United States. IEEE, 2015, IEEE Nuclear and Space Radiation Effects Conferencee, Boston, USA, 2015. 〈http://www.nsrec.com/2015Brochure.pdf〉. 〈lirmm-01237731〉

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