Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults

Imran Wali 1 Arnaud Virazel 2 Alberto Bosio 2 Luigi Dilillo 2 Patrick Girard 2 Aida Todri-Sanial 2
1 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : CMOS technology trends at one side open up some opportunities like making small and power efficient devices available, which in turn allow to put more functionality into a single chip. However, on the other side it poses some challenges like making devices vulnerable to hard and soft errors. In this paper we propose an efficient fault-tolerant architecture able to deal with permanent and transient faults in combinational parts of pipeline structures. The principle consists in triplicating the combinational logic parts but, unlike TMR, only two copies are running in parallel while the third one remains in standby until an error is detected. We implement this approach on a MIPS microprocessor as case study to make it resilient against transient and permanent faults.
Keywords : hard errors fault-tolerant architecture combinational logic protection MIPS microprocessor CMOS technology microprocessor chips combinational circuits CMOS logic circuits permanent faults pipeline structures pipelined microprocessor cores power efficient devices soft errors transient faults Circuit faults Computer architecture Fault tolerance Fault tolerant systems Microprocessors Pipelines Transient analysis combinational logic microprocessor redundancy transient and permanent faults
Type de document :
Communication dans un congrès
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.223-225, 2014, 〈10.1109/DDECS.2014.6868794〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248598
Contributeur : Aida Todri-Sanial <>
Soumis le : dimanche 27 décembre 2015 - 21:41:34
Dernière modification le : mardi 25 septembre 2018 - 14:30:02

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SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | SMARTIES | TEST

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Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.223-225, 2014, 〈10.1109/DDECS.2014.6868794〉. 〈lirmm-01248598〉

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