Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles IEEE Transactions on Nuclear Science Year : 2015

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Abstract

During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

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Electronics Physics [physics]

Luigi Dilillo  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01254157

Submitted on : Monday, January 11, 2016-6:37:09 PM

Last modification on : Monday, October 16, 2023-4:51:35 PM

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lirmm-01254157 , version 1 (11-01-2016)

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Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩. ⟨lirmm-01254157⟩

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CNRS IES SYSMIC LIRMM TEST LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
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