Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser 1 Viyas Gupta 1 Georgios Tsiligiannis 2 Arto Javanainen Heikki Kettunen Helmut Puchner Frédéric Saigné 3, 4 Ari Virtanen Frédéric Wrobel 3, 4 Luigi Dilillo 2
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 RADIAC - Radiations et composants
IES - Institut d’Electronique et des Systèmes
Abstract : During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
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Journal articles
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01254157
Contributor : Luigi Dilillo <>
Submitted on : Monday, January 11, 2016 - 6:37:09 PM
Last modification on : Monday, July 1, 2019 - 10:28:03 AM

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Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩. ⟨lirmm-01254157⟩

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