Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Abstract : During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
Type de document :
Article dans une revue
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6), pp.2620-2626. 〈http://ieeexplore.ieee.org/Xplore/home.jsp〉. 〈10.1109/TNS.2015.2496874〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01254157
Contributeur : Luigi Dilillo <>
Soumis le : lundi 11 janvier 2016 - 18:37:09
Dernière modification le : jeudi 11 janvier 2018 - 06:27:29

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Alexandre Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, et al.. Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2015, 62 (6), pp.2620-2626. 〈http://ieeexplore.ieee.org/Xplore/home.jsp〉. 〈10.1109/TNS.2015.2496874〉. 〈lirmm-01254157〉

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