This paper provides a comparative study based on experiments performed on four similar fault-tolerant architectures intended to reduce errors caused due to faults in combinational logic parts of microelectronic circuits and systems. The compared merits include area, power, performance and fault tolerance capability. The experimental results show that the improved Hybrid Fault-Tolerant Architecture can handle transient faults as effectively as Partial-TMR and exhibits permanent fault tolerance capability similar to that of Full-TMR. It offers 11.8% and 20.5% power saving compared to Partial and Full-TMR respectively. Furthermore, it can handle the fault accumulation effect better than TMR, hence an ideal candidate for low-power long duration mission-critical applications.