Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect

Amit Karel 1 Mariane Comte 1 Jean-Marc Galliere 1 Florence Azaïs 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01374300
Contributor : Florence Azais <>
Submitted on : Friday, September 30, 2016 - 11:18:06 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

Identifiers

Collections

Citation

Amit Karel, Mariane Comte, Jean-Marc Galliere, Florence Azaïs, Michel Renovell. Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS: Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩. ⟨lirmm-01374300⟩

Share

Metrics

Record views

106