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Journal Articles IEEE Transactions on Nuclear Science Year : 2016

Methodologies for the Statistical Analysis of Memory Response to Radiation

Helmut Puchner

Abstract

Methodologies are proposed for in-depth statistical analysis of Single Event Upset data. The motivation for using these methodologies is to obtain precise information on the intrinsic defects and weaknesses of the tested devices, and to gain insight on their failure mechanisms, at no additional cost. The case study is a 65 nm SRAM irradiated with neutrons, protons and heavy ions. This publication is an extended version of a previous study.

Dates and versions

lirmm-01382508 , version 1 (17-10-2016)

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Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Christopher Frost, Ali Mohammad Zadeh, et al.. Methodologies for the Statistical Analysis of Memory Response to Radiation. IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩. ⟨lirmm-01382508⟩
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