Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate Students - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2016

Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate Students

Abstract

This paper presents a return of experience relative to per peers learning approach to teach industrial test of integrated circuits (IC) to undergraduate students from Polytech Montpellier, using the test platform of the CNFM. The objectives of this innovative approach are double: technical and educational. The students have to acquire knowledge and competencies about IC testing (test methods, test program development, debugging, diagnosis, test results and graph analysis technics) in a way they are the protagonists of their own learning and the one of their peers. A specific course organization has been put in place as well as dedicated training materials combining quizzes and video tutorials have been developed to guide the students achieving this new role. A course evaluation form has been created, based on the F2A Louvain University one, to help the students providing classifiable feedback about this new educational approach. The analysis of the students' exam results is presented.
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Dates and versions

lirmm-01385619 , version 1 (21-10-2016)

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Béatrice Pradarelli, Pascal Nouet, Laurent Latorre. Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate Students. EWME: European Workshop on Microelectronics Education, May 2016, Southampton, United Kingdom. ⟨10.1109/EWME.2016.7496485⟩. ⟨lirmm-01385619⟩
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