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Conference Papers Year : 2013

Laser-Induced Fault Simulation

Abstract

This paper presents a multi-level simulator for laser-induced fault simulation in digital circuits. It automatically performs the simulation of laser-induced faults using layout information and laser spot information in order to locate affected gates and derive fault-models. The paper mainly focuses on multi-level simulation for obtaining high accuracy of the fault simulation at transistor level and high speed for the simulation of the rest of the circuit. This multi-level process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.
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Dates and versions

lirmm-01430807 , version 1 (10-01-2017)

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Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Laser-Induced Fault Simulation. EUROMICRO DSD/SEAA, Sep 2013, Santander, Spain. pp.609-614, ⟨10.1109/DSD.2013.72⟩. ⟨lirmm-01430807⟩
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