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Conference papers
Laser-Induced Fault Simulation
Abstract : This paper presents a multi-level simulator for laser-induced fault simulation in digital circuits. It automatically performs the simulation of laser-induced faults using layout information and laser spot information in order to locate affected gates and derive fault-models. The paper mainly focuses on multi-level simulation for obtaining high accuracy of the fault simulation at transistor level and high speed for the simulation of the rest of the circuit. This multi-level process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.
Cited literature [9 references]
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01430807
Contributor : Caroline Lebrun <>
Submitted on : Tuesday, January 10, 2017 - 11:58:13 AM
Last modification on : Thursday, February 7, 2019 - 4:51:33 PM
Document(s) archivé(s) le : Tuesday, April 11, 2017 - 2:19:10 PM
Contributor : Caroline Lebrun <>
Submitted on : Tuesday, January 10, 2017 - 11:58:13 AM
Last modification on : Thursday, February 7, 2019 - 4:51:33 PM
Document(s) archivé(s) le : Tuesday, April 11, 2017 - 2:19:10 PM
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06628333.pdf
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