Abstract : This paper presents a multi-level simulator for laser-induced fault simulation in digital circuits. It automatically performs the simulation of laser-induced faults using layout information and laser spot information in order to locate affected gates and derive fault-models. The paper mainly focuses on multi-level simulation for obtaining high accuracy of the fault simulation at transistor level and high speed for the simulation of the rest of the circuit. This multi-level process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01430807
Contributor : Caroline Lebrun <>
Submitted on : Tuesday, January 10, 2017 - 11:58:13 AM Last modification on : Tuesday, September 1, 2020 - 11:32:04 AM Long-term archiving on: : Tuesday, April 11, 2017 - 2:19:10 PM