Skip to Main content Skip to Navigation
Conference papers

Laser-Induced Fault Simulation

Feng Lu 1, 2 Giorgio Di Natale 2 Marie-Lise Flottes 2 Bruno Rouzeyre 2 
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper presents a multi-level simulator for laser-induced fault simulation in digital circuits. It automatically performs the simulation of laser-induced faults using layout information and laser spot information in order to locate affected gates and derive fault-models. The paper mainly focuses on multi-level simulation for obtaining high accuracy of the fault simulation at transistor level and high speed for the simulation of the rest of the circuit. This multi-level process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.
Complete list of metadata

Cited literature [9 references]  Display  Hide  Download

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01430807
Contributor : Caroline Lebrun Connect in order to contact the contributor
Submitted on : Tuesday, January 10, 2017 - 11:58:13 AM
Last modification on : Friday, August 5, 2022 - 10:48:08 AM
Long-term archiving on: : Tuesday, April 11, 2017 - 2:19:10 PM

File

06628333.pdf
Publisher files allowed on an open archive

Identifiers

Collections

Citation

Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Laser-Induced Fault Simulation. EUROMICRO DSD/SEAA, Sep 2013, Santander, Spain. pp.609-614, ⟨10.1109/DSD.2013.72⟩. ⟨lirmm-01430807⟩

Share

Metrics

Record views

108

Files downloads

251