Abstract : This paper presents a multi-level simulator for laser-induced fault simulation in digital circuits. It automatically performs the simulation of laser-induced faults using layout information and laser spot information in order to locate affected gates and derive fault-models. The paper mainly focuses on multi-level simulation for obtaining high accuracy of the fault simulation at transistor level and high speed for the simulation of the rest of the circuit. This multi-level process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01430807
Contributeur : Caroline Lebrun
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Soumis le : mardi 10 janvier 2017 - 11:58:13
Dernière modification le : mardi 23 octobre 2018 - 10:46:02
Document(s) archivé(s) le : mardi 11 avril 2017 - 14:19:10
