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Laser-Induced Fault Simulation

Feng Lu 1, 2 Giorgio Di Natale 2 Marie-Lise Flottes 2 Bruno Rouzeyre 2
1 HUST - Huazhong University of Science and Technology [Wuhan]
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper presents a multi-level simulator for laser-induced fault simulation in digital circuits. It automatically performs the simulation of laser-induced faults using layout information and laser spot information in order to locate affected gates and derive fault-models. The paper mainly focuses on multi-level simulation for obtaining high accuracy of the fault simulation at transistor level and high speed for the simulation of the rest of the circuit. This multi-level process allows handling natural and maliciously induced physical phenomenon leading to circuit misbehavior, while dealing with large circuits.
Keywords : Multi-level Fault Simulation Layout-Oriented Fault Simulation PLS Effects
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LIRMM | CNRS | SYSMIC | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER | TEST

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Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Laser-Induced Fault Simulation. EUROMICRO DSD/SEAA, Sep 2013, Santander, Spain. pp.609-614, ⟨10.1109/DSD.2013.72⟩. ⟨lirmm-01430807⟩

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