An Embedded Digital Sensor against EM and BB Fault Injection

Abstract : Fault Attacks methods like Electro-Magnetic PulseInjection or Body Biasing Injection have recently been demon-strated to be efficient against smartcards and Systems on Chip. As of now, security is a main constraint in product development, even for low-cost products riding the trend of the IoT (mostof these devices operate in hostile environments). Unfortunately, the implementation of hardware countermeasures has a costin silicon area, design time and performance. Therefore, it isimportant to develop protections while taking into account theircosts and easyness of implementation. One way to achieve theseends would be to have an all-in-one fully digital detector whoseintegration is compliant with the standard cell design flow. Inthis perspective, we propose an enhanced sensor to detect severaltypes of attacks by exploiting analog phenomena induced at thegate level, instead of the attack itself. This paper describes thedesign and the implementation into FPGAs of this sensor, as wellas experimental tests demonstrating its effectiveness for detectingelectro-magnetic and body bias fault injection attempts.
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Communication dans un congrès
FDTC: Fault Diagnosis and Tolerance in Cryptography, Aug 2016, Santa Barbara, CA, United States. IEEE, Workshop on Fault Diagnosis and Tolerance in Cryptography, pp.78-86, 2016, 〈http://conferenze.dei.polimi.it/FDTC16/〉. 〈10.1109/FDTC.2016.14〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01434028
Contributeur : Caroline Lebrun <>
Soumis le : vendredi 13 janvier 2017 - 10:51:30
Dernière modification le : mercredi 7 mars 2018 - 10:54:01

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David El-Baze, Jean-Baptiste Rigaud, Philippe Maurine. An Embedded Digital Sensor against EM and BB Fault Injection. FDTC: Fault Diagnosis and Tolerance in Cryptography, Aug 2016, Santa Barbara, CA, United States. IEEE, Workshop on Fault Diagnosis and Tolerance in Cryptography, pp.78-86, 2016, 〈http://conferenze.dei.polimi.it/FDTC16/〉. 〈10.1109/FDTC.2016.14〉. 〈lirmm-01434028〉

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