Juergen Alt, Paolo Bernardi, Alberto Bosio, Ricardo Cantoro, Hans Kerkhoff, et al.. Thermal issues in test: An overview of the significant aspects and industrial practice.
VTS: VLSI Test Symposium, Apr 2016, Las Vegas, NV, United States.
⟨10.1109/VTS.2016.7477278⟩.
⟨lirmm-01447125⟩