An effective approach for functional test programs compaction

Abstract : Functional test guarantees that the circuit is tested under normal conditions, thus avoiding any over-as well as under-test. This work is based on the use of Software-Based-Self-Test that allows a special application of functional test to the processor-based systems. This strategy applies the so-called functional test programs that are executed by the processor to guarantee a given fault coverage. The main goal of this paper is to investigate the static test compaction of a given set of functional test programs. The investigation aims at understanding and determining how to select the best functional test program candidates to obtain the smallest set having the best fault coverage. Results carried out on two different microprocessors show that a 49% reduction in test length and a 28.7% reduction in test application time can be achieved.
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Communication dans un congrès
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2016, Kosice, Slovakia. IEEE, 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2016, 〈http://ddecs2016.fiit.stuba.sk/DDECS_2016/〉. 〈10.1109/DDECS.2016.7482466〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457396
Contributeur : Caroline Lebrun <>
Soumis le : lundi 6 février 2017 - 14:18:29
Dernière modification le : jeudi 28 juin 2018 - 18:44:03

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Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, et al.. An effective approach for functional test programs compaction. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2016, Kosice, Slovakia. IEEE, 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2016, 〈http://ddecs2016.fiit.stuba.sk/DDECS_2016/〉. 〈10.1109/DDECS.2016.7482466〉. 〈lirmm-01457396〉

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