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Electromigration Alleviation Techniques for 3D Integrated Circuits

Yuanqing Cheng Aida Todri-Sanial 1 Alberto Bosio 2 Luigi Dilillo 2 Patrick Girard 2 Arnaud Virazel 2 Pascal Vivet Marc Belleville
1 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01800220
Contributor : Caroline Lebrun <>
Submitted on : Friday, May 25, 2018 - 4:25:41 PM
Last modification on : Wednesday, December 11, 2019 - 1:32:02 AM

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  • HAL Id : lirmm-01800220, version 1

Citation

Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Electromigration Alleviation Techniques for 3D Integrated Circuits. Chao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996. ⟨lirmm-01800220⟩

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