Electromigration Alleviation Techniques for 3D Integrated Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Book Sections Year : 2017
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lirmm-01800220 , version 1 (25-05-2018)

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  • HAL Id : lirmm-01800220 , version 1

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Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Electromigration Alleviation Techniques for 3D Integrated Circuits. Chao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996. ⟨lirmm-01800220⟩
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