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Conference Poster Year : 2018

Scan chain encryption in Test Standards

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics
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Mathieu Da Silva  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01882578

Submitted on : Thursday, September 27, 2018-10:54:26 AM

Last modification on : Friday, March 24, 2023-2:53:08 PM

Long-term archiving on: Friday, December 28, 2018-2:06:10 PM

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Dates and versions

lirmm-01882578 , version 1 (27-09-2018)
lirmm-01882578 , version 2 (10-10-2018)

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  • HAL Id : lirmm-01882578 , version 1

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Mathieu da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre. Scan chain encryption in Test Standards. SURREALIST: SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices, May 2018, Bremen, Germany. , Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices, 2018. ⟨lirmm-01882578v1⟩

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