Skip to Main content Skip to Navigation
Conference papers

The impact of pulsed electromagnetic fault injection on true random number generators

Maxime Madau 1 Michel Agoyan 2 Josep Balash Milos Grujic Patrick Haddad 2 Philippe Maurine 1 Vladimir Rozic 3 Dave Singelee 4 Bohan Yang 5 Ingrid Verbauwhede 5
1 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 ST-ROUSSET - STMicroelectronics [Rousset]
3 KU Leuven - Catholic University of Leuven - Katholieke Universiteit Leuven
4 ESAT-COSIC - Computer Security and Industrial Cryptography [KU Leuven]
KU-ESAT - Department of Electrical Engineering [KU Leuven]
5 ESAT/SCD-COSIC - Department of Electrical Engineering - K.U.Leuven
Abstract : Random number generation is a key function of today's secure devices. Commonly used for key generation, random number streams are more and more frequently used as the anchor of trust of several countermeasures such as masking. True Random Number Generators (TRNGs) thus become a relevant entry point for attacks that aim at lowering the security of integrated systems. Within this context, this paper investigates the robustness of TRNGs based on Ring Oscillators (focusing on the delay chain TRNG) against pulsed electromagnetic fault injection. Indeed, weaknesses in generating random bits for masking scheme degenerate the Side Channel resistance. Finally by exploiting fault results on delay chain TRNG some general guidelines to harden them are derived.
Document type :
Conference papers
Complete list of metadatas
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01943112
Contributor : Philippe Maurine <>
Submitted on : Friday, December 20, 2019 - 2:14:39 PM
Last modification on : Friday, December 20, 2019 - 2:36:55 PM

Annex

Identifiers

Collections

LIRMM | MIPS | MIC | LIRMM_MIC | CNRS | UNIV-MONTPELLIER | SMARTIES

Citation

Maxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, et al.. The impact of pulsed electromagnetic fault injection on true random number generators. FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.43-48, ⟨10.1109/FDTC.2018.00015⟩. ⟨lirmm-01943112⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

153

Files downloads

32

Contact

Informations

CCSD