The impact of pulsed electromagnetic fault injection on true random number generators

Maxime Madau; Michel Agoyan; Josep Balash; Milos Grujic; Patrick Haddad; Philippe Maurine; Vladimir Rozic; Dave Singelee; Bohan Yang; Ingrid Verbauwhede

doi:10.5281/zenodo.1434075

The impact of pulsed electromagnetic fault injection on true random number generators

Maxime Madau ¹ Michel Agoyan ² Josep Balash Milos Grujic Patrick Haddad ² Philippe Maurine ¹ Vladimir Rozic ³ Dave Singelee ⁴ Bohan Yang ⁵ Ingrid Verbauwhede ⁵

1 SmartIES - Smart Integrated Electronic Systems

LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier

2 ST-ROUSSET - STMicroelectronics [Rousset]

3 KU Leuven - Catholic University of Leuven - Katholieke Universiteit Leuven

4 ESAT-COSIC - Computer Security and Industrial Cryptography [KU Leuven]

KU-ESAT - Department of Electrical Engineering [KU Leuven]

5 ESAT/SCD-COSIC - Department of Electrical Engineering - K.U.Leuven

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-01943112
Contributor : Philippe Maurine <>
Submitted on : Monday, December 3, 2018 - 4:01:22 PM
Last modification on : Friday, February 22, 2019 - 1:48:04 PM

The impact of pulsed electromagnetic fault injection on true random number generators

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The impact of pulsed electromagnetic fault injection on true random number generators

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