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Conference papers

The impact of pulsed electromagnetic fault injection on true random number generators

Maxime Madau 1 Michel Agoyan 2 Josep Balash 3 Milos Grujic 3 Patrick Haddad 2 Philippe Maurine 1 Vladimir Rozic 3 Dave Singelee 4 Bohan Yang 5 Ingrid Verbauwhede 5
1 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 ST-ROUSSET - STMicroelectronics [Rousset]
3 KU Leuven - Catholic University of Leuven - Katholieke Universiteit Leuven
4 ESAT-COSIC - Computer Security and Industrial Cryptography [KU Leuven]
KU-ESAT - Department of Electrical Engineering [KU Leuven]
5 ESAT/SCD-COSIC - Department of Electrical Engineering - K.U.Leuven
Abstract : Random number generation is a key function of today's secure devices. Commonly used for key generation, random number streams are more and more frequently used as the anchor of trust of several countermeasures such as masking. True Random Number Generators (TRNGs) thus become a relevant entry point for attacks that aim at lowering the security of integrated systems. Within this context, this paper investigates the robustness of TRNGs based on Ring Oscillators (focusing on the delay chain TRNG) against pulsed electromagnetic fault injection. Indeed, weaknesses in generating random bits for masking scheme degenerate the Side Channel resistance. Finally by exploiting fault results on delay chain TRNG some general guidelines to harden them are derived.
Keywords : Pulse Electromagnetic fault Injection True Random Number Generators security guidelines Hardware security
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01943112
Contributor : Philippe Maurine Connect in order to contact the contributor
Submitted on : Friday, December 20, 2019 - 2:14:39 PM
Last modification on : Friday, April 1, 2022 - 3:58:43 AM

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LIRMM | MIPS | MIC | LIRMM_MIC | CNRS | UNIV-MONTPELLIER | SMARTIES | AXESECULIRMM

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Maxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, et al.. The impact of pulsed electromagnetic fault injection on true random number generators. FDTC 2018 - Workshop on Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.43-48, ⟨10.1109/FDTC.2018.00015⟩. ⟨lirmm-01943112⟩

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