Maxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, et al.. The impact of pulsed electromagnetic fault injection on true random number generators.
FDTC 2018 - Workshop on Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.43-48,
⟨10.1109/FDTC.2018.00015⟩.
⟨lirmm-01943112⟩