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Conference papers
The impact of pulsed electromagnetic fault injection on true random number generators
Maxime Madau
1
Michel Agoyan
2
Josep Balash
Milos Grujic
Patrick Haddad
2
Philippe Maurine
1
Vladimir Rozic
3
Dave Singelee
4
Bohan Yang
5
Ingrid Verbauwhede
5
1
SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
4
ESAT-COSIC - Computer Security and Industrial Cryptography [KU Leuven]
KU-ESAT - Department of Electrical Engineering [KU Leuven]
Maxime Madau 1
Author Employer institution : STMicroelectronics [Rousset]
Michel Agoyan 2
Author
Josep Balash
Author Employer institution : Catholic University of Leuven - Katholieke Universiteit Leuven
Milos Grujic
Author Employer institution : Catholic University of Leuven - Katholieke Universiteit Leuven
Patrick Haddad 2
Author Employer institution : STMicroelectronics [Rousset]
Philippe Maurine 1
Author Employer institution : Université de Montpellier IdHAL : philippe-maurine
Vladimir Rozic 3
Author
Dave Singelee 4
Author Employer institution : Catholic University of Leuven - Katholieke Universiteit Leuven
Bohan Yang 5
Author
Ingrid Verbauwhede 5
Author
1
SmartIES - Smart Integrated Electronic Systems (France)
- LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (161 rue Ada - 34095 Montpellier - France)
- UM - Université de Montpellier : UMR5506 (163 rue Auguste Broussonnet - 34090 Montpellier - France)
- CNRS - Centre National de la Recherche Scientifique : UMR5506 (France)
2
ST-ROUSSET - STMicroelectronics [Rousset] (ZI de Peynier Rousset, avenue Celestin Coq - 13790 Rousset - France)
3
KU Leuven - Catholic University of Leuven - Katholieke Universiteit Leuven (Oude Markt 13 - bus 5005, 3000 Leuven - Belgium)
4
ESAT-COSIC - Computer Security and Industrial Cryptography [KU Leuven] (Kasteelpark Arenberg 10 B-3001 Leuven-Heverlee - Belgium)
- KU-ESAT - Department of Electrical Engineering [KU Leuven] (Kasteelpark Arenberg 10, B-3001 Heverlee - Belgium)
- KU Leuven - Catholic University of Leuven - Katholieke Universiteit Leuven (Oude Markt 13 - bus 5005, 3000 Leuven - Belgium)
5
ESAT/SCD-COSIC - Department of Electrical Engineering - K.U.Leuven (ESAT/SCD-COSIC and IBBT, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee - Belgium)
Abstract : Random number generation is a key function of today's secure devices. Commonly used for key generation, random number streams are more and more frequently used as the anchor of trust of several countermeasures such as masking. True Random Number Generators (TRNGs) thus become a relevant entry point for attacks that aim at lowering the security of integrated systems. Within this context, this paper investigates the robustness of TRNGs based on Ring Oscillators (focusing on the delay chain TRNG) against pulsed electromagnetic fault injection. Indeed, weaknesses in generating random bits for masking scheme degenerate the Side Channel resistance. Finally by exploiting fault results on delay chain TRNG some general guidelines to harden them are derived.
Document type :
Conference papers
Complete list of metadata
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01943112
Contributor : Philippe Maurine <>
Submitted on : Friday, December 20, 2019 - 2:14:39 PM
Last modification on : Friday, December 20, 2019 - 2:36:55 PM
Contributor : Philippe Maurine <>
Submitted on : Friday, December 20, 2019 - 2:14:39 PM
Last modification on : Friday, December 20, 2019 - 2:36:55 PM
Identifiers
- HAL Id : lirmm-01943112, version 1
- DOI : 10.1109/FDTC.2018.00015
Citation
Maxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, et al.. The impact of pulsed electromagnetic fault injection on true random number generators. FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.43-48, ⟨10.1109/FDTC.2018.00015⟩. ⟨lirmm-01943112⟩
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