The impact of pulsed electromagnetic fault injection on true random number generators

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01943112
Contributor : Philippe Maurine <>
Submitted on : Monday, December 3, 2018 - 4:01:22 PM
Last modification on : Friday, February 22, 2019 - 1:48:04 PM

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Maxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, et al.. The impact of pulsed electromagnetic fault injection on true random number generators. FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. ⟨10.5281/zenodo.1434075⟩. ⟨lirmm-01943112⟩

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