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Software controlled cell bit-density to improve NAND flash lifetime

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02094087
Contributor : David Novo <>
Submitted on : Tuesday, April 9, 2019 - 2:22:36 PM
Last modification on : Wednesday, April 10, 2019 - 10:51:57 AM

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Xavier Jimenez, David Novo, Paolo Ienne. Software controlled cell bit-density to improve NAND flash lifetime. DAC: Design Automation Conference, Jun 2012, San Francisco, United States. pp.229-234, ⟨10.1145/2228360.2228404⟩. ⟨lirmm-02094087⟩

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