A Method for Trading Test Time, Area and Fault Coverage in Datapath BIST Synthesis - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2001

A Method for Trading Test Time, Area and Fault Coverage in Datapath BIST Synthesis

Abstract

This paper presents a method for deriving a BIST specification from the initial specification of datapaths. This method minimizes BIST area overhead under test time constraint while guaranteeing a user chosen fault coverage. The designer can thus explore a wide range of solutions and keep the one that best fits with design constraints. Results show great improvements over lower level techniques.
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Dates and versions

lirmm-02288800 , version 1 (16-09-2019)

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David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre. A Method for Trading Test Time, Area and Fault Coverage in Datapath BIST Synthesis. Journal of Electronic Testing: : Theory and Applications, 2001, 17 (3/4), pp.331-339. ⟨10.1023/A:1012227715327⟩. ⟨lirmm-02288800⟩
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