Skip to Main content Skip to Navigation
Journal articles

A Method for Trading Test Time, Area and Fault Coverage in Datapath BIST Synthesis

Abstract : This paper presents a method for deriving a BIST specification from the initial specification of datapaths. This method minimizes BIST area overhead under test time constraint while guaranteeing a user chosen fault coverage. The designer can thus explore a wide range of solutions and keep the one that best fits with design constraints. Results show great improvements over lower level techniques.
Complete list of metadatas

Cited literature [17 references]  Display  Hide  Download

https://hal-lirmm.ccsd.cnrs.fr/lirmm-02288800
Contributor : Isabelle Gouat <>
Submitted on : Monday, September 16, 2019 - 9:46:23 AM
Last modification on : Tuesday, September 17, 2019 - 1:17:07 AM
Long-term archiving on: : Saturday, February 8, 2020 - 4:32:46 PM

File

A_Method_for_Trading_off_Test_...
Files produced by the author(s)

Identifiers

Collections

Citation

David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre. A Method for Trading Test Time, Area and Fault Coverage in Datapath BIST Synthesis. Journal of Electronic Testing, Springer Verlag, 2001, 17 (3/4), pp.331-339. ⟨10.1023/A:1012227715327⟩. ⟨lirmm-02288800⟩

Share

Metrics

Record views

48

Files downloads

36