A Method for Trading Test Time, Area and Fault Coverage in Datapath BIST Synthesis
Résumé
This paper presents a method for deriving a BIST specification from the initial specification of datapaths. This method minimizes BIST area overhead under test time constraint while guaranteeing a user chosen fault coverage. The designer can thus explore a wide range of solutions and keep the one that best fits with design constraints. Results show great improvements over lower level techniques.
Fichier principal
A_Method_for_Trading_off_Test_Time_Area_and_Fault_.pdf (117.84 Ko)
Télécharger le fichier
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|---|
| Licence |
Loading...