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A Survey of Testing Techniques for Approximate Integrated Circuits

Marcello Traiola 1 Arnaud Virazel 1 Patrick Girard 1 Mario Barbareschi 2 Alberto Bosio 1
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Submitted on : Thursday, December 5, 2019 - 3:40:41 PM
Last modification on : Saturday, December 7, 2019 - 1:41:41 AM

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Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio. A Survey of Testing Techniques for Approximate Integrated Circuits. Proceedings of the IEEE, Institute of Electrical and Electronics Engineers, In press. ⟨lirmm-02395609⟩

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