Special session: How approximate computing impacts verification, test and reliability - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2018

Special session: How approximate computing impacts verification, test and reliability

Abstract

Two AxC techniques have been successfully applied to hardware components. The first one is the functional approximation [1]that modifies the circuit structure replacing the original function F with the function G. G implementation leads to area/energy reduction at the cost of reduced accuracy, meaning that some errors can be observed at the outputs of G. The observed errors are a variation between the output values of F (precise) and G (approximate). The variation is the accuracy loss measured by means of quality metric(s) [1]. The second AxC technique is the over-scaling based approximation. Basically, the HW component is forced to work outside its specified operating conditions [1]. The classical example is the reduction of the supply voltage under the minimum value.
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Dates and versions

lirmm-02421106 , version 1 (20-12-2019)

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Lukas Sekanina, Zdeněk Vašíček, Alberto Bosio, Marcello Traiola, Paolo Rech, et al.. Special session: How approximate computing impacts verification, test and reliability. 36th VLSI Test Symposium (VTS), Apr 2018, San Francisco, CA, United States. ⟨10.1109/VTS.2018.8368628⟩. ⟨lirmm-02421106⟩
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