Guest Editorial: IEEE Transactions on Emerging Topics in Computing Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era
Résumé
The ten papers in this special section address issues related to the design, reliability, security and testing of integrated systems in the nanoscale era. These papers cover a wide spectrum of techniques, including the issues of low-power design, the test, the reliability, the security and trust of circuits manufactured with emerging technologies.