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Journal Articles IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Year : 2021

Modeling and Simulating Electromagnetic Fault Injection

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Abstract

Electromagnetic Fault Injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only little information on how EMFI generates faults. Within this context, this paper aims at filling this lack by proposing a complete understanding and modeling of EM induction on Integrated Circuits (IC). The presented model is confronted to experiments to endorse its soundness.
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Dates and versions

lirmm-02938004 , version 1 (14-09-2020)

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Mathieu Lisart, Philippe Maurine, Mathieu Dumont. Modeling and Simulating Electromagnetic Fault Injection. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, 40 (4), pp.680-693. ⟨10.1109/TCAD.2020.3003287⟩. ⟨lirmm-02938004⟩
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