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Conference Papers Year : 2020

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

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Serge Bernard
Vincent Kerzérho
Laurent Latorre
François Lefèvre
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  • PersonId : 1081074

Abstract

Systems on a chip have seen their surface area increased by a factor of 10 and their consumption multiplied by 5 during the last ten years. Each technological node that enabled this integration has also added new constraints challenging the overall system reliability. In addition, the integration of analog/RF blocks adds specific issues, in particular the high cost of the required test equipment. It is therefore necessary to improve test and reliability solutions in order to guarantee the production yield and the system lifetime. Moreover, the massive increase in the use of communicating systems has introduced security as a cornerstone of their development. The entire hardware production flow is therefore subject to security and trust issues requiring the development of dedicated test solutions. In this paper, we focus on LIRMM contributions in the HADES project especially with details on Embedded Test Instruments (ETIs) for reliability of digital ICs, low-cost RF test based on indirect DC measurements or digital ATE capture, management of secure scan access.
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Dates and versions

lirmm-02993384 , version 1 (06-11-2020)

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Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, et al.. Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩. ⟨lirmm-02993384⟩
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