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Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

Florence Azaïs 1 Serge Bernard 2 Mariane Comte 1 Bastien Deveautour 1 Sophie Dupuis 1 Hassan El Badawi 1 Marie-Lise Flottes 1 Patrick Girard 1 Vincent Kerzérho 2 Laurent Latorre 2 François Lefèvre 3 Bruno Rouzeyre 1 Emanuele Valea 1 Thibault Vayssade 1 Arnaud Virazel 1
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Systems on a chip have seen their surface area increased by a factor of 10 and their consumption multiplied by 5 during the last ten years. Each technological node that enabled this integration has also added new constraints challenging the overall system reliability. In addition, the integration of analog/RF blocks adds specific issues, in particular the high cost of the required test equipment. It is therefore necessary to improve test and reliability solutions in order to guarantee the production yield and the system lifetime. Moreover, the massive increase in the use of communicating systems has introduced security as a cornerstone of their development. The entire hardware production flow is therefore subject to security and trust issues requiring the development of dedicated test solutions. In this paper, we focus on LIRMM contributions in the HADES project especially with details on Embedded Test Instruments (ETIs) for reliability of digital ICs, low-cost RF test based on indirect DC measurements or digital ATE capture, management of secure scan access.
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Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, et al.. Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩. ⟨lirmm-02993384⟩

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