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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-03028881
Contributor : Luigi Dilillo <>
Submitted on : Friday, November 27, 2020 - 6:03:30 PM
Last modification on : Sunday, November 29, 2020 - 3:18:47 AM

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  • HAL Id : lirmm-03028881, version 1

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Daniel Soderstrom, Lucas Matana Luza, Heikki Kettunen, Arto Javanainen, Wilfrid Farabolini, et al.. Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment. IEEE Nuclear and Space Radiation Effects Conference (NSREC), Nov 2020, Santa Fe (virtual), United States. ⟨lirmm-03028881⟩

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