Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation Environments - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles IEEE Transactions on Emerging Topics in Computing Year : 2022

Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation Environments

Aibin Yan
Zhelong Xu
  • Function : Author
  • PersonId : 1083518
Xiangfeng Feng
  • Function : Author
  • PersonId : 1083519
Jie Cui
Zhili Chen
  • Function : Author
  • PersonId : 1083521
Tianming Ni
Zhengfeng Huang
Xiaoqing Wen

Abstract

With the rapid advancement of CMOS technologies, nano-scale CMOS latches have become increasingly sensitive to multiple-node upset (MNU) errors caused by radiations. First, this paper proposes a novel latch design, namely QNUTL that can completely tolerate MNUs such as double-node upsets, triple-node upsets (TNUs), and even quadruple-node upsets (QNUs). The latch is mainly constructed from three dual-interlocked-storage-cells (DICEs) and a triple-level soft-error interceptive module (SIM) that consists of six 2-input C-elements. Due to the single-node-upset self-recoverability of DICEs and the soft-error interception of the SIM, the latch can completely tolerate any QNU. Next, by replacing the DICEs in the QNUTL latch by clock-gating (CG) based ones, a QNUTL-CG latch is proposed to significantly reduce power consumption. Simulation results demonstrate the MNU-tolerance of the proposed latches. Moreover, owing to the use of a high-speed transmission path, clock-gating, and a few transistors, the proposed QNUTL-CG latch has low overhead in terms of area, D-Q delay, CLK-Q delay, and setup time, compared with the state-of-the-art TNU-tolerant latch (TNUTL) which is not QNU-tolerant.
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Dates and versions

lirmm-03031709 , version 1 (30-11-2020)

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Cite

Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui, Zhili Chen, et al.. Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Transactions on Emerging Topics in Computing, 2022, 10 (1), pp.404-413. ⟨10.1109/TETC.2020.3025584⟩. ⟨lirmm-03031709⟩
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