On the Comparison of Different ATPG approaches for Approximate Integrated Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2018

On the Comparison of Different ATPG approaches for Approximate Integrated Circuits

Abstract

Approximate Computing (AxC) emerges more and more as a new paradigm for the design of energy-efficient Integrated Circuits (ICs) at the cost of accuracy reduction. The latter has to be modeled and quantified by means of Error Metrics. From the testing point of view, AxC Integrated Circuits offer an opportunity. Instead of testing for all manufacturing defects, the goal is to test only for those that will lead to an error considered as not acceptable by the adopted Error Metrics. The main advantages are the test cost reduction, since the number of required test vectors will be reduced, and the yield improvement. We developed three approaches for generating test vectors targeting AxC Integrated Circuits. This paper aims at comparing these approaches on a public benchmark suite.
Fichier principal
Vignette du fichier
On the Comparison of Different ATPG approaches for Approximate Integrated Circuits.pdf (463.61 Ko) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

lirmm-03032856 , version 1 (01-12-2020)

Identifiers

Cite

Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio. On the Comparison of Different ATPG approaches for Approximate Integrated Circuits. DDECS 2018 - 1st International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2018, Budapest, Hungary. pp.85-90, ⟨10.1109/DDECS.2018.00022⟩. ⟨lirmm-03032856⟩
35 View
155 Download

Altmetric

Share

Gmail Facebook X LinkedIn More