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Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors

Zhengda Dou 1 Aibin Yan 1 Jun Zhou 1 Yuanjie Hu 1 Yan Chen 1 Tianming Ni 1 Jie Cui 1 Patrick Girard 2 Xiaoqing Wen 3
2 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this paper, a highly reliable SRAM cell, namely SESRS cell, is proposed. Since the cell has a special feedback mechanism among its internal nodes and has more access transistors compared to a standard SRAM cell, the SESRS cell provides the following advantages: (1) it can self-recover from single node upsets (SNUs) and double-node upsets (DNUs); (2) it can reduce power consumption by 49.78% and silicon area by 7.92%, compared with the only existing SRAM cell which can self-recover from all possible DNUs. Simulation results validate the robustness of the proposed SESRS cell. Moreover, compared with the state-of-the-art hardened SRAM cells, the proposed SESRS cell can reduce read access time by 61.93% on average.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-03033821
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Submitted on : Tuesday, December 1, 2020 - 3:13:19 PM
Last modification on : Wednesday, December 2, 2020 - 3:28:39 AM
Long-term archiving on: : Tuesday, March 2, 2021 - 7:40:07 PM

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Zhengda Dou, Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, et al.. Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. IEEE International Test Conference in Asia (ITC-Asia), Sep 2020, Taipei, Taiwan. pp.35-40, ⟨10.1109/ITC-Asia51099.2020.00018⟩. ⟨lirmm-03033821⟩

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