Diagnosis is crucial in order to establish the root cause of observed failures in Systems-on-Chip (SoC). In this paper, we present a new framework based on supervised learning for cellaware defect diagnosis of customer returns. By using a Naive Bayes classifier to accurately identify defect candidates, the proposed flow indistinctly deals with static and dynamic defects that may occur in actual circuits. Results achieved on benchmark circuits, as well as comparison with a commercial cell-aware diagnosis tool, show the effectiveness of the proposed framework in terms of accuracy and resolution. Moreover, the proposed flow has been experimented and validated on industrial circuits (two test chips and one customer return from STMicroelectronics), thus corroborating the results achieved on benchmark circuits.