A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2021

A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns

Abstract

Diagnosis is crucial in order to establish the root cause of observed failures in Systems-on-Chip (SoC). In this paper, we present a new framework based on supervised learning for cellaware defect diagnosis of customer returns. By using a Naive Bayes classifier to accurately identify defect candidates, the proposed flow indistinctly deals with static and dynamic defects that may occur in actual circuits. Results achieved on benchmark circuits, as well as comparison with a commercial cell-aware diagnosis tool, show the effectiveness of the proposed framework in terms of accuracy and resolution. Moreover, the proposed flow has been experimented and validated on industrial circuits (two test chips and one customer return from STMicroelectronics), thus corroborating the results achieved on benchmark circuits.
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Dates and versions

lirmm-03034264 , version 1 (01-12-2020)

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Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar. A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns. ITC 2020 - IEEE International Test Conference, Nov 2020, Washington DC, United States. pp.1-10, ⟨10.1109/ITC44778.2020.9325246⟩. ⟨lirmm-03034264⟩
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