An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2020

An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM

Abstract

Memory system reliability is a serious concern in many systems today and is becoming more worrisome as technology scales, system size grows and the demand of aggressive voltage reduction becomes more stringent. Thus, disposing of memory repair architectures with strong fault tolerance capability at low cost is desirable. In this context, Error Correcting Codes (ECC)-based repair techniques were proposed and offer aggressive reduction of the repair cost for high defect densities. However, an important issue in advanced process nodes is the fact that, single particles induce Single-Event Upsets (SEUs) in neighbor memory cells, thus leading to Multi-Cell Upsets (MCUs) and Multi-Bit Upsets (MBUs), when they occur in the same memory word. In the case of memories, there exist efficient approaches mitigating this kind of MBUs, in particular the use of interleaving. But when a memory is repaired, the impact of MBUs on the circuitry repairing the faulty memory words should also be mitigated. This can be done by using a repair Content Addressable Memory (CAM) having interleaving at its data-words, or else an Offset CAM. In this paper we present and evaluate a novel repair approach that uses the Offset CAM in ECC-based Memory Repair and hence permits the mitigation of the MBUs affecting it.
Fichier principal
Vignette du fichier
Final_Vers_OFF-SET_CAM_ECCBASEDREPAIR_iolts20b-try1_An ECC-Based.pdf (1.35 Mo) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

lirmm-03035798 , version 1 (02-12-2020)

Identifiers

Cite

Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard. An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-6, ⟨10.1109/IOLTS50870.2020.9159731⟩. ⟨lirmm-03035798⟩
82 View
108 Download

Altmetric

Share

Gmail Facebook X LinkedIn More