Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2021

Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata

Abstract

In this paper, a new XOR gate is discussed in quantum-dot cellular automata (QCA). The proposed gate is a single layer structure with no crossovers, and has been designed with redundant cells to increase the amplitude of the output signal and to improve the fault tolerance and reliability of the circuit. Based on the performance comparison, the investigated XOR gate has very high fault tolerance to single-cell addition and single-cell omission defects, thereby making them suitable candidates for designing reliable QCA based digital circuits.
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Dates and versions

lirmm-03377787 , version 1 (14-10-2021)

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Cite

Syed Farah Naz, Ambika Prasad Shah, Suhaib Ahmed, Patrick Girard, Michael Waltl. Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata. ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-2, ⟨10.1109/ETS50041.2021.9465459⟩. ⟨lirmm-03377787⟩
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