SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2022

SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments

Aibin Yan
Jie Cui
Tianming Ni
Xiaoqing Wen

Abstract

As the CMOS technology is continuously scaling down, nano-scale integrated circuits are becoming susceptible to harsh-radiation induced soft errors, such as double-node upsets (DNUs) and triple-node upsets (TNUs). This paper presents a shuttle C-elements based low-cost and robust latch (namely SCLCRL) that can recover from any TNU in harsh radiation environments. The latch comprises seven primary storage nodes and seven secondary storage nodes. Each pair of primary nodes feeds a secondary node through one C-element (CE) and each pair of secondary nodes feeds a primary node through another CE, forming redundant feedback loops to robustly retain values. Simulation results validate all key TNUs' recoverability features of the proposed latch. Simulation results also demonstrate that the proposed SCLCRL latch can approximately save 29% silicon area and 47% D-Q delay on average at the cost of moderate power, compared with the state-of-the-art TNU-recoverable reference latches of the same-type.
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Dates and versions

lirmm-03769070 , version 1 (05-09-2022)

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Aibin Yan, Zhixing Li, Shiwei Huang, Zijie Zhai, Xiangyu Cheng, et al.. SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments. DATE 2022 - 25th Design, Automation and Test in Europe Conference and Exhibition, Mar 2022, Virtual, France. pp.1257-1262, ⟨10.23919/DATE54114.2022.9774665⟩. ⟨lirmm-03769070⟩
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