Test and Reliability of Electronic Circuits in Natural and Radiative Environment - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Habilitation À Diriger Des Recherches Year : 2015

Test and Reliability of Electronic Circuits in Natural and Radiative Environment

Abstract

There is a single and continuous line that links my learning career, scientific activities, teaching activities, projects and collaborations. At the beginning of my research career, the skills accumulated with the studies in microelectronics were applied to memory test. Next, this experience allowed making a further step towards the researches on diagnostic, reliability, power-aware test and low power circuits. At this point, I was ready to start my researches in a neighboring science field: radiation and spatial studies. This latest activity is growing a lot in my works and it is strongly combined with my initial interests. My research perspectives are linked with the ongoing works and projects on testing, spatial and radiation fields.
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Dates and versions

tel-01259002 , version 1 (19-01-2016)

Identifiers

  • HAL Id : tel-01259002 , version 1

Cite

Luigi Dilillo. Test and Reliability of Electronic Circuits in Natural and Radiative Environment. Electronics. Université de Montpellier, 2015. ⟨tel-01259002⟩
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