Unified Framework for Logic Diagnosis

Abstract : This paper presents a unified diagnosis method targeting most of the fault models used in practice today. This framework is intended to be used to diagnose faulty behaviors in nanometric circuits for which the classical stuck-at fault model is far to cover all realistic failures. The method is based on an Effect-Cause approach which relies on the two following main operations. The first one is based on critical path tracing (CPT) [4] and consists in identifying critical lines in the Circuit Under Test (CUT) which can be the source of observed errors. The second one consists in allocating a set of possible fault models to each critical line, so that root causes of failures can be finally determined. The main advantage of this method is that it does not need to explicitly consider each fault model during the diagnosis process.
Type de document :
Communication dans un congrès
IEEE. EWDTW'06: Proceedings of the IEEE East-West Design & Test Workshop, Sep 2006, Sochi, Russia, pp.47-52, 2006
Liste complète des métadonnées

Littérature citée [14 références]  Voir  Masquer  Télécharger

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00096211
Contributeur : Martine Peridier <>
Soumis le : mardi 19 septembre 2006 - 10:47:47
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19
Document(s) archivé(s) le : lundi 5 avril 2010 - 23:24:11

Identifiants

  • HAL Id : lirmm-00096211, version 1

Collections

Citation

Alexandre Rousset, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Unified Framework for Logic Diagnosis. IEEE. EWDTW'06: Proceedings of the IEEE East-West Design & Test Workshop, Sep 2006, Sochi, Russia, pp.47-52, 2006. 〈lirmm-00096211〉

Partager

Métriques

Consultations de la notice

99

Téléchargements de fichiers

86